Real-time detection and auto-focusing of beam profiles from silicon photonics gratings using the YOLO model

Abstract

When observing chip-to-free-space light beams from silicon photonics (SiPh) to free space, manual adjustment of camera lens is often required to obtain a focused image of the light beams. In this Letter, we demonstrated an auto-focusing system based on the you-only-look-once (YOLO) model. The trained YOLO model exhibits high classification accuracy of 99.7% and high confidence level of >0.95 when detecting light beams from SiPh gratings. A video demonstration of real-time light beam detection, real-time computation of beam widths, and auto-focusing of light beams is also included.