Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/182293
Title: Image compressive sensing reconstruction via nonlocal low-rank residual-based ADMM framework
Authors: Zhang, Junhao
Yap, Kim-Hui
Chau, Lap-Pui
Zhu, Ce
Keywords: Computer and Information Science
Issue Date: 2024
Source: Zhang, J., Yap, K., Chau, L. & Zhu, C. (2024). Image compressive sensing reconstruction via nonlocal low-rank residual-based ADMM framework. Computer Vision and Image Understanding, 249, 104204-. https://dx.doi.org/10.1016/j.cviu.2024.104204
Journal: Computer Vision and Image Understanding
Abstract: The nonlocal low-rank (LR) modeling has proven to be an effective approach in image compressive sensing (CS) reconstruction, which starts by clustering similar patches using the nonlocal self-similarity (NSS) prior into nonlocal image group and then imposes an LR penalty on each nonlocal image group. However, most existing methods only approximate the LR matrix directly from the degraded nonlocal image group, which may lead to suboptimal LR matrix approximation and thus obtain unsatisfactory reconstruction results. In this paper, we propose a novel nonlocal low-rank residual (NLRR) approach for image CS reconstruction, which progressively approximates the underlying LR matrix by minimizing the LR residual. To do this, we first use the NSS prior to obtaining a good estimate of the original nonlocal image group, and then the LR residual between the degraded nonlocal image group and the estimated nonlocal image group is minimized to derive a more accurate LR matrix. To ensure the optimization is both feasible and reliable, we employ an alternative direction multiplier method (ADMM) to solve the NLRR-based image CS reconstruction problem. Our experimental results show that the proposed NLRR algorithm achieves superior performance against many popular or state-of-the-art image CS reconstruction methods, both in objective metrics and subjective perceptual quality.
URI: https://hdl.handle.net/10356/182293
ISSN: 1077-3142
DOI: 10.1016/j.cviu.2024.104204
Schools: School of Electrical and Electronic Engineering 
Rights: © 2024 Published by Elsevier Inc. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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