Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/182369
Title: On performance of distributed RIS-aided communication in random networks
Authors: Xu, Jindan
Xu, Wei
Yuen, Chau
Keywords: Engineering
Issue Date: 2024
Source: Xu, J., Xu, W. & Yuen, C. (2024). On performance of distributed RIS-aided communication in random networks. IEEE Transactions On Wireless Communications, 23(12), 18254-18270. https://dx.doi.org/10.1109/TWC.2024.3463796
Project: MOE-T2EP50220-0019 
FCP-NTU-RG-2024-025
Journal: IEEE Transactions on Wireless Communications
Abstract: This paper evaluates the geometrically averaged performance of a wireless communication network assisted by a multitude of distributed reconfigurable intelligent surfaces (RISs), where the RIS locations are randomly dropped obeying a homogeneous Poisson point process. By exploiting stochastic geometry and then averaging over the random locations of RISs as well as the serving user, we first derive a closed-form expression for the spatially ergodic rate in the presence of phase errors at the RISs in practice. Armed with this closed-form characterization, we then optimize the RIS deployment under a reasonable and fair constraint of a total number of RIS elements per unit area. The optimal configurations in terms of key network parameters, including the RIS deployment density and the array sizes of RISs, are disclosed for the spatially ergodic rate maximization. Our findings suggest that deploying larger-size RISs with reduced deployment density is theoretically preferred to support extended RIS coverages, under the cases of bounded phase shift errors. However, when dealing with random phase shifts, the reflecting elements are recommended to spread out as much as possible, disregarding the deployment cost.Furthermore, the spatially ergodic rate loss due to the phase shift errors is quantitatively characterized. For bounded phase shift errors, the rate loss is eventually upper bounded by a constant as N ∞, where N is the number of reflecting elements at each RIS. While for random phase shifts, this rate loss scales up in the order of N These analytical observations are validated through numerical results.
URI: https://hdl.handle.net/10356/182369
ISSN: 1536-1276
DOI: 10.1109/TWC.2024.3463796
Schools: School of Electrical and Electronic Engineering 
Rights: © 2024 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

SCOPUSTM   
Citations 50

2
Updated on May 7, 2025

Page view(s)

40
Updated on May 6, 2025

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.