Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/19561
Title: Fabrication and characterization of MR thin films using IBS system
Authors: Qian, Yin
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
Issue Date: 1997
Abstract: Recently magnetoresistive films have received great attention because of their applications in magnetic recording. One of the most used materials is Permalloy(NiFe) film, since this material has the low coercivity, anisotropy field and magnetostriction. It is thought as the most preferred single layer material in this area. The ion beam sputtering system is thought as the ideal equipment for the investigation of the influence of deposition parameters on the thin film because it can independently control various parameters that may influence the film growth. These parameters include sputtering ion energy and density and bombardment ion energy and density.
URI: http://hdl.handle.net/10356/19561
Rights: NANYANG TECHNOLOGICAL UNIVERSITY
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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