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|Title:||A pattern-based approach to self-tuning process control||Authors:||Toh, Kar Ann.||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering||Issue Date:||1998||Abstract:||This thesis addresses the issues of performing closed-loop process identification under unknown load disturbances and reference step change, hence achieving a self-tuning controller that makes good use of the available on-line spatial-temporal information for control. A new method for process dynamic parameter identification utilizing the closed-loop response patterns is proposed. The main contribution is to be seen through our establishment of a formal basis for the pattern-based method for closed-loop process identification.||URI:||http://hdl.handle.net/10356/19770||Rights:||NANYANG TECHNOLOGICAL UNIVERSITY||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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