Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/19770
Title: A pattern-based approach to self-tuning process control
Authors: Toh, Kar Ann.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering
Issue Date: 1998
Abstract: This thesis addresses the issues of performing closed-loop process identification under unknown load disturbances and reference step change, hence achieving a self-tuning controller that makes good use of the available on-line spatial-temporal information for control. A new method for process dynamic parameter identification utilizing the closed-loop response patterns is proposed. The main contribution is to be seen through our establishment of a formal basis for the pattern-based method for closed-loop process identification.
URI: http://hdl.handle.net/10356/19770
Rights: NANYANG TECHNOLOGICAL UNIVERSITY
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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