Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/19770
Full metadata record
DC FieldValueLanguage
dc.contributor.authorToh, Kar Ann.en_US
dc.date.accessioned2009-12-14T06:37:01Z-
dc.date.available2009-12-14T06:37:01Z-
dc.date.copyright1998en_US
dc.date.issued1998-
dc.identifier.urihttp://hdl.handle.net/10356/19770-
dc.description.abstractThis thesis addresses the issues of performing closed-loop process identification under unknown load disturbances and reference step change, hence achieving a self-tuning controller that makes good use of the available on-line spatial-temporal information for control. A new method for process dynamic parameter identification utilizing the closed-loop response patterns is proposed. The main contribution is to be seen through our establishment of a formal basis for the pattern-based method for closed-loop process identification.en_US
dc.format.extent267 p.-
dc.language.isoen-
dc.rightsNANYANG TECHNOLOGICAL UNIVERSITYen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation::Control engineering-
dc.titleA pattern-based approach to self-tuning process controlen_US
dc.typeThesisen_US
dc.contributor.supervisorSong, Qingen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeDoctor of Philosophy (EEE)en_US
item.fulltextWith Fulltext-
item.grantfulltextrestricted-
Appears in Collections:EEE Theses
Files in This Item:
File Description SizeFormat 
EEE_THESES_3.pdf
  Restricted Access
30.16 MBAdobe PDFView/Open

Page view(s) 50

442
Updated on Jul 18, 2024

Download(s)

4
Updated on Jul 18, 2024

Google ScholarTM

Check

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.