Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/19823
Title: Integrated testing and algorithms for computer visual inspection of integrated circuits
Authors: Heng, Aik Swan.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 1988
Abstract: An automated visual inspection system for Pre-Cap inspection of integrated circuits is presented. This system applys a proposed database-structural-feature technique to inspect wirebond patterns. Four algorithms, one on pre-inspection alignment, one each on inspection of "ball" bonds and "wedge" bonds, and last on inspection of "crescent" welds, together with results obtained, are discussed. A survey of the various computer visual techniques for integrated circuits is also provided.
URI: http://hdl.handle.net/10356/19823
Schools: School of Electrical and Electronic Engineering 
Rights: NANYANG TECHNOLOGICAL UNIVERSITY
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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