Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/2697
Title: Investigation and design of built-in self-test techniques for digital logic circuits
Authors: Wong, Eddie M. C.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2000
Abstract: The report emphasizes on the design of testing techniques for digital circuits.
URI: http://hdl.handle.net/10356/2697
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Research Reports (Staff & Graduate Students)

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