Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/2697
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wong, Eddie M. C. | en_US |
dc.date.accessioned | 2008-09-17T09:13:14Z | - |
dc.date.available | 2008-09-17T09:13:14Z | - |
dc.date.copyright | 2000 | en_US |
dc.date.issued | 2000 | - |
dc.identifier.uri | http://hdl.handle.net/10356/2697 | - |
dc.description.abstract | The report emphasizes on the design of testing techniques for digital circuits. | en_US |
dc.rights | Nanyang Technological University | en_US |
dc.subject | DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits | - |
dc.title | Investigation and design of built-in self-test techniques for digital logic circuits | en_US |
dc.type | Research Report | en_US |
dc.contributor.school | School of Electrical and Electronic Engineering | en_US |
dc.description.reportnumber | RP 23/91 | - |
item.fulltext | With Fulltext | - |
item.grantfulltext | restricted | - |
Appears in Collections: | EEE Research Reports (Staff & Graduate Students) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
EEE-RESEARCH-REPORT_114.pdf Restricted Access | 1.12 MB | Adobe PDF | View/Open |
Page view(s)
410
Updated on Mar 27, 2024
Download(s)
4
Updated on Mar 27, 2024
Google ScholarTM
Check
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.