Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/2713
Title: Automatic test chip set
Authors: Chin, Edward Hsi Ling.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2000
Abstract: In this project, the fundamental functions and basic circuitry of an universal pin electronics are investigated and designed.
URI: http://hdl.handle.net/10356/2713
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Research Reports (Staff & Graduate Students)

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