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|Title:||Grazing incidence X-Ray reflectometry for characterization of extremely thin films grown on substrates||Authors:||Swaminathan, S.
Yoon, Soon Fatt.
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
|Issue Date:||2000||Abstract:||Using existing double axis resolution x-ray diffractometer, the grazing incidence reflectivity is studied.||URI:||http://hdl.handle.net/10356/2732||Rights:||Nanyang Technological University||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Research Reports (Staff & Graduate Students)|
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