Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/2735
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dc.contributor.authorZhang, Qingen_US
dc.date.accessioned2008-09-17T09:14:00Z
dc.date.available2008-09-17T09:14:00Z
dc.date.copyright2000en_US
dc.date.issued2000
dc.identifier.urihttp://hdl.handle.net/10356/2735
dc.description.abstractThe primary objective of this project is to investigate the optical absorption using photothermal deflection spectroscopy (PDS), C-C bonding structures using Raman spectroscopy and film surface morphology using x-ray reflectivity for diamond-like carbon (DLC) films, which were deposited using either electron cyclotron resonance chemical vapor deposition (CVD) or plasma enhanced CVD.en_US
dc.rightsNanyang Technological Universityen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
dc.titleCharacterization of amorphous and diamond like carbon films using photothermal deflection spectorscopyen_US
dc.typeResearch Reporten_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.reportnumberRG 59/96
item.grantfulltextrestricted-
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Appears in Collections:EEE Research Reports (Staff & Graduate Students)
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