Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/3032| Title: | Internal microprobing at VLSI chips | Authors: | Liu, Po Ching. Chin, Edward Hsi Ling. |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits | Issue Date: | 1990 | Abstract: | Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing techniques are presented. | URI: | http://hdl.handle.net/10356/3032 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Research Reports (Staff & Graduate Students) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-RESEARCH-REPORT_88.pdf Restricted Access | 15.59 MB | Adobe PDF | View/Open |
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