Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/3032
Title: Internal microprobing at VLSI chips
Authors: Liu, Po Ching.
Chin, Edward Hsi Ling.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 1990
Abstract: Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing techniques are presented.
URI: http://hdl.handle.net/10356/3032
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Research Reports (Staff & Graduate Students)

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