Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/3148
Title: Review and analysis of device characterization structures and methodologies used for mixed signal integrated circuits
Authors: Purakh Raj Verma.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2003
Abstract: This project focues on the evaluation of the various characterization techniques and test structure designs for both active and passive component used in deep sub-micron high frequency mixed signal (analog/digital) integrated circuits. Key device parameters and matching of both passive components (resistors & capacitor) and active components (mainly MOS transistors) are discussed in detail.
URI: http://hdl.handle.net/10356/3148
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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