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DC Field | Value | Language |
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dc.contributor.author | Qin, Kai | en |
dc.date.accessioned | 2008-09-17T09:23:25Z | en |
dc.date.available | 2008-09-17T09:23:25Z | en |
dc.date.copyright | 2007 | en |
dc.date.issued | 2007 | en |
dc.identifier.citation | Qin, K. (2007). Dimensionality and prototype reduction techniques for pattern analysis. Doctoral thesis, Nanyang Technological University, Singapore. | en |
dc.identifier.uri | https://hdl.handle.net/10356/3153 | en |
dc.description.abstract | This thesis investigates two important topics in the statistical pattern recognition field, namely dimensionality reduction for supervised classification and prototype reduction for unsupervised classification. For dimensionality reduction part, we concentrate on the Discriminative Linear Dimensionality Reduction (DLDR) techniques with feature extraction for supervised classification as the major application. For prototype reduction part, we focus on the prototype-based clustering algorithms. | en |
dc.rights | Nanyang Technological University | en |
dc.subject | DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems | en |
dc.subject | DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition | en |
dc.title | Dimensionality and prototype reduction techniques for pattern analysis | en |
dc.type | Thesis | en |
dc.contributor.supervisor | Ponnuthurai N. Suganthan | en |
dc.contributor.school | School of Electrical and Electronic Engineering | en |
dc.description.degree | DOCTOR OF PHILOSOPHY (EEE) | en |
dc.identifier.doi | 10.32657/10356/3153 | en |
item.fulltext | With Fulltext | - |
item.grantfulltext | open | - |
Appears in Collections: | EEE Theses |
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File | Description | Size | Format | |
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EEE-THESES_1043.pdf | 1.37 MB | Adobe PDF | View/Open |
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