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Title: Control on yield variations between testers using monitoring-test
Authors: Seshadri Raghavendra Murali.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation
Issue Date: 2001
Abstract: In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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