Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/3338
Title: RF testing of QPSK device
Authors: Chan, Siew Meng.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2004
Abstract: The concepts of RF testing of a QPSK device are introduced and followed by the presentation of the simulation results of a common RF tests involving a Quadrature Phase Shift Keying (QPSK) modulator and demodulator.
URI: http://hdl.handle.net/10356/3338
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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