Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/3405
Title: Development and characterization of a surface plasmon resonance sensor
Authors: Tan, Yen Geow.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2004
Abstract: Study of the SPR sensor paying particular attention to the Kretchmann configuration. The idea of double layers metal film design is investigated, theoretical simulations will be carried out and the sensor developed and its characteristic studied and verified.
URI: http://hdl.handle.net/10356/3405
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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