Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/3457
Title: Efficient and accurate extraction of full-wave equivalent circuit for printed circuit structures
Authors: Chua, Eng Kee
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2007
Source: Chua, E. K. (2007). Efficient and accurate extraction of full-wave equivalent circuit for printed circuit structures. Doctoral thesis, Nanyang Technological University, Singapore.
Abstract: Due to the ever-increasing clock speeds of electronic devices, PCB layouts of high-speed digital circuits become very challenging due to electromagnetic interference (EMI) and signal integrity (SI) design issues. The purpose of PCB is to provide the necessary signal and power interconnections for the digital integrated circuit mounted on board. Without due diligence in PCB layout, the electronic device could malfunction due to poor SI design and worst still, it could fail the maximum allowable radiated emission limit specified by the mandatory EMI regulation. The way that the interconnecting traces laid on a PCB plays a crucial role on meeting the SI and EMI design requirements. Based on full-wave modelling approach, this thesis presents an accurate and efficient algorithm that is capable of extracting the full-wave electrical model of any arbitrary printed circuit structure. The extracted electrical model is compatible with any SPICE-based simulation tool. The full-wave electrical model allows electronic engineers to perform SI and EMI analyses of specific PCB layout using the familiar SPICE-based design tools without another set of electromagnetic simulation tool.
URI: https://hdl.handle.net/10356/3457
DOI: 10.32657/10356/3457
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

Files in This Item:
File Description SizeFormat 
EEE-THESES_1317.pdf1.11 MBAdobe PDFThumbnail
View/Open

Page view(s) 20

759
Updated on Mar 17, 2025

Download(s) 20

275
Updated on Mar 17, 2025

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.