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|Title:||Image analysis using random fields and Bayesian methods||Authors:||Chen, Chibiao.||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Electronic systems||Issue Date:||2004||Abstract:||This thesis deals with the problems of image analysis. The focus is set on low level image analysis.||URI:||http://hdl.handle.net/10356/3504||Rights:||Nanyang Technological University||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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