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https://hdl.handle.net/10356/3543| Title: | 0.18 um DRAM product electrical failure analysis for prediction of physical defects | Authors: | Tej Bahadur Megh Raj. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Power electronics | Issue Date: | 2004 | Abstract: | Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM). | URI: | http://hdl.handle.net/10356/3543 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-THESES_1395.pdf Restricted Access | 14.27 MB | Adobe PDF | View/Open |
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