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Title: Technology prediction with semi-empirical compact modeling approach
Authors: Tan, William.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
Issue Date: 2003
Abstract: The aim of this project is to explore the prediction of new CMOS technology parameters with the aid of a semi-empirical compact model that has been calibrated to the given technology. The compact model parameters will be extracted from a given technology data and, whenever possible, correlated to process parameters. Extrapolation to scaled devices will be studied for optimizing the performance with variation of major process parameters.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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