Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/3762
Title: Material characterization using electron beam induced current
Authors: Wu, Det Hau.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
Issue Date: 2003
Abstract: This research work presented in this thesis is concerned with the determination of material parameters of a semiconductor specimen from the EBIC signals.
URI: http://hdl.handle.net/10356/3762
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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