Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/3839
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dc.contributor.authorYang, Linen_US
dc.date.accessioned2008-09-17T09:38:45Z
dc.date.available2008-09-17T09:38:45Z
dc.date.copyright2001en_US
dc.date.issued2001
dc.identifier.urihttp://hdl.handle.net/10356/3839
dc.description.abstractThis thesis presents a novel two current probes methods that allow accurate and reliable measurement of noise source impedance of SMPS. Based on the developed noise source model, a systematic approach to design a power filter design for a specific SMPS is now possible.en_US
dc.rightsNanyang Technological Universityen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
dc.titleMeasurement of noise source impedance of SMPS using two current probes methoden_US
dc.typeThesisen_US
dc.contributor.supervisorSee, Kye Yaken_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeMaster of Engineeringen_US
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