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https://hdl.handle.net/10356/3904| Title: | MOSFET noise modeling for wireless applications | Authors: | Chen, Xuezhong. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Wireless communication systems | Issue Date: | 2003 | Abstract: | This thesis presents a high-frequency noise model of MOS (Metal Oxide Semiconductor) devices. The high frequency (HF) noise model is based on the equivalent circuit of the MOS device, but it takes into account both the gate resistance distribution and hot carrier effect. | URI: | http://hdl.handle.net/10356/3904 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-THESES_172.pdf Restricted Access | 2.31 MB | Adobe PDF | View/Open |
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