Please use this identifier to cite or link to this item:
Title: Image analysis and recognition by affine invariant features
Authors: Zhang, Yani.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Issue Date: 2002
Abstract: This thesis addresses several issues in the field of pattern recognition. The main achievements are in the development of invariant features under affine transformation. For recognition of blur degraded and simultaneously affine deformed images, we proposed a moment based normalization method to construct the blur and affine combined invariant features.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

Files in This Item:
File Description SizeFormat 
  Restricted Access
10.25 MBAdobe PDFView/Open

Google ScholarTM


Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.