Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4010
Title: Image analysis and recognition by affine invariant features
Authors: Zhang, Yani.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Issue Date: 2002
Abstract: This thesis addresses several issues in the field of pattern recognition. The main achievements are in the development of invariant features under affine transformation. For recognition of blur degraded and simultaneously affine deformed images, we proposed a moment based normalization method to construct the blur and affine combined invariant features.
URI: http://hdl.handle.net/10356/4010
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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