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|Title:||Image analysis and recognition by affine invariant features||Authors:||Zhang, Yani.||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing||Issue Date:||2002||Abstract:||This thesis addresses several issues in the field of pattern recognition. The main achievements are in the development of invariant features under affine transformation. For recognition of blur degraded and simultaneously affine deformed images, we proposed a moment based normalization method to construct the blur and affine combined invariant features.||URI:||http://hdl.handle.net/10356/4010||Rights:||Nanyang Technological University||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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