Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/40246
Title: Transistor DC parameter extraction for high-power and high-frequency applications
Authors: Yap, Jok Ping.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Power electronics
Issue Date: 2010
Abstract: The goal of this project is to implement an automated DC parameters program, which will extract the measurement data obtained from a probe station which performs measurement on transistor. Follow by data analysis, the purpose of analysis is to extract DC parameters to characterize a process and provide a qualitative basis for high power and high frequency device-design issues. Parameters extracted in this project include: maximum drain current (Idmax), knee voltage (Vknee), leakage of drain and gate current (Idleak & Igleak), drain source resistance (Rds), maximum transconductance (gmmax), threshold voltage (Vth), source resistance (Rs), intrinsic transconductance (gm0), breakdown voltage (BVgd) and thermal conductivity percentage. Finally, using the extracted Gallium Nitride (GaN) based high electron mobility (HEMT) DC parameters to compare the device’s performance with the function of gate length (Lg) and gate drain length (Lgd).
URI: http://hdl.handle.net/10356/40246
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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