Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/40691
Title: Optoelectronic properties of nanocrystals
Authors: Chen, Tian Yi.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2010
Abstract: Nanocrystals, of which their size and shape determine their optical properties are becoming a viable and cost effective replacement for many of the current optoelectronics devices like solar cells and lasers. Upcoming technologies like optical single electron memory also sees great potential being realised with nanocrystals. Not only are the properties tuneable with different fabrication techniques, some of them are also compatible with mainstream CMOS fabrication technologies as well. In this final year project, we shall gain an insight into the potential of nanocrystals as well as show you a novel way of automating ellipsometry characterisation for nanocrystalline thin films. We will outline how Matlab can be used to write a program that reduces time spent doing calculations and thus improve the characterisation efficacy for thin film based nanocrystal samples in this report.
URI: http://hdl.handle.net/10356/40691
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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