Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/40720
Title: Properties of thin metal films
Authors: Lee, Meng Teck.
Keywords: DRNTU::Engineering
Issue Date: 2010
Abstract: This project is to develop meta-materials for visible frequencies and explore their application in high resolution/magnification imaging, enhancement of photonic device and cloaking. The COMSOL Multiphysics 3.5 programme is use for designing the various filling ratio and period of metal + dielectric of meta-materials. Using this programme, Power Flow and FWHM values can extract from various designs. The chosen value of Power Flow and FWHM will be useful for fabricating nano-scale metal and dielectric materials using sputtering machine. Lastly, ellipsometer is also use to investigate the dielectric properties of thin films in comparison with the simulation result using COMSOL programme.
URI: http://hdl.handle.net/10356/40720
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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