Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4086
Full metadata record
DC FieldValueLanguage
dc.contributor.authorZhu, Xiaolingen
dc.date.accessioned2008-09-17T09:44:07Zen
dc.date.available2008-09-17T09:44:07Zen
dc.date.copyright2005en
dc.date.issued2005en
dc.identifier.citationZhu, X. (2005). Robust face detection in cluttered images. Master’s thesis, Nanyang Technological University, Singapore.en
dc.identifier.urihttps://hdl.handle.net/10356/4086en
dc.description.abstractIn this thesis, we present a robust face detection algorithm in cluttered images. It is a system based on a novel feature extraction method that uses wavelet-based sub- kernel principal component analysis (SKPCA) method. Usually, facial features such as eyebrows, eyes, nose and mouth are distinguished characteristics of human face, and that their global structure distribution is a guarantee of the existence of a face. The proposed method firstly transfers gray value images into a Haar wavelet spatial frequency domain to extract visually plausible features of the shape and interior detail of faces, Following this step, the constructed wavelet coefficients are mapped onto a higher dimensional feature space using SKPCA. By this way the structure distribution of laces can be captured. Theoretically, SKPCA is an extension of kernel principal component analysis algorithm (KPCA). In the process of SKPCA, a simple and effective subset choosing method is used to solve the computational and storage problems of KPCA. Via wavelet-based SKPCA feature extraction method, representative features of face images that include both local facial feature detail and global structure characteristic are constructed. Finally, a relatively simple support vector machine (SVM) is adopted as classifier.en
dc.rightsNanyang Technological Universityen
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Biometricsen
dc.titleRobust face detection in cluttered imagesen
dc.typeThesisen
dc.contributor.supervisorWang Hanen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.description.degreeMASTER OF ENGINEERING (EEE)en
dc.identifier.doi10.32657/10356/4086en
item.grantfulltextopen-
item.fulltextWith Fulltext-
Appears in Collections:EEE Theses
Files in This Item:
File Description SizeFormat 
EEE-THESES_1884.pdf13.59 MBAdobe PDFThumbnail
View/Open

Page view(s) 50

600
Updated on Apr 29, 2025

Download(s) 50

275
Updated on Apr 29, 2025

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.