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https://hdl.handle.net/10356/4140| Title: | Enabling scanning moire phase shifting interferometry in image processing | Authors: | Chin, Chee Hwa. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Electronic systems | Issue Date: | 2004 | Abstract: | A method for on-the-fly 3-D surface profilometry using scanning moire phase shifting interferometry is proposed. The proposed optical setup allows on-the-fly phase shifting analysis without phase shifting mechanism. | URI: | http://hdl.handle.net/10356/4140 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-THESES_204.pdf Restricted Access | 4.06 MB | Adobe PDF | View/Open |
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