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|Title:||Latchup characterization of submicrometer CMOS||Authors:||Chow, Jane Sze Mun.||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits||Issue Date:||2003||Abstract:||The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method.||URI:||http://hdl.handle.net/10356/4163||Rights:||Nanyang Technological University||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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