Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4163
Title: Latchup characterization of submicrometer CMOS
Authors: Chow, Jane Sze Mun.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2003
Abstract: The main purpose of this project is to study the latchup phenomenon in submicrometer CMOS devices and investigate the effects of spike annealing process on latchup sensitivity. Latchup characterization was carried out by a steady-state latchup triggering method.
URI: http://hdl.handle.net/10356/4163
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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