Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/4166| Title: | Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology | Authors: | Chow, Yew Tuck. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Electric apparatus and materials | Issue Date: | 2004 | Abstract: | The main focus of this report is to improve the hot-carrier lifetime of a 0.25 micrometer CMOS device. | URI: | http://hdl.handle.net/10356/4166 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-THESES_228.pdf Restricted Access | 11.75 MB | Adobe PDF | View/Open |
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