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|Title:||The test development of 32-bit micro-controller||Authors:||Hao, Juan.||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Microelectronics||Issue Date:||2004||Abstract:||The dissertation will present the test development flow, from DFT (Design For Test) concept, to test program implemented on the ATE (Automatic Test Equipment), which includes DFT concept, test pattern generation, conversion, simulation and integrated the test program on Teradyne 5750 tester. The ATPG SCAN test coverage for production test is more than 98%. Furthermore, AC characterization implementation on Teradyne 5750 tester will be discussed to satisfy customer’s requirements and ATE testing environment.||URI:||http://hdl.handle.net/10356/4341||Rights:||Nanyang Technological University||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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