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Title: The test development of 32-bit micro-controller
Authors: Hao, Juan.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Issue Date: 2004
Abstract: The dissertation will present the test development flow, from DFT (Design For Test) concept, to test program implemented on the ATE (Automatic Test Equipment), which includes DFT concept, test pattern generation, conversion, simulation and integrated the test program on Teradyne 5750 tester. The ATPG SCAN test coverage for production test is more than 98%. Furthermore, AC characterization implementation on Teradyne 5750 tester will be discussed to satisfy customer’s requirements and ATE testing environment.
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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