Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4437
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dc.contributor.authorJiang, Chaoen_US
dc.date.accessioned2008-09-17T09:51:27Z
dc.date.available2008-09-17T09:51:27Z
dc.date.copyright2003en_US
dc.date.issued2003
dc.identifier.urihttp://hdl.handle.net/10356/4437
dc.description.abstractWe have successfully fabricated, assembled and characterized the ISFET devices for pH measurement. After electrical measurement on wafer-level to confine the wafer fabrication process, the fabricated wafer was cut into individual ISFET dice. The ISFET dice was then mounted on printing circuit board (PCB).en_US
dc.rightsNanyang Technological Universityen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Microelectronics
dc.titleFabrication and characterization of ISFET for PH measurementsen_US
dc.typeThesisen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeMaster of Science (Microelectronics)en_US
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