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Title: Fringing effect on the dielectric constant measurement: experiment and simulation
Authors: Tan, Yi Ling.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Issue Date: 2011
Abstract: All major supply components such as transformers and cables need to be in kept in perfect operating condition. Their insulation must be able to withstand high voltages stresses. Hence, it is crucial that their conditions can be verified throughout their life cycle. The measurement of permittivity of dielectric material is important to identify the partial discharge in the insulation of high voltage transmission application to prevent any electrical breakdown. This report covers the studying of the fringing effect on the measurement of permittivity of different permittivity using Ansoft Maxwell simulation program. This report begins with the utilization of Ansoft Maxwell 2D program to stimulate and study the fringing effect on a pair of electrodes cylindrical model with dielectric materials of various permittivities inserting between them. For further analysis purpose, the simulation results will be exported out to Microsoft excel to undergo a calculation procedure before obtaining the measured permittivity values and thus, a comparison is made between the measured permittivity and intrinsic permittivity to observe the fringing effect caused by the various permittivity. To obtain a more precise result in the second half of the report, Ansoft Maxwell 3D is used to simulate a pair of electrodes with dielectric materials of various permittivities inserting between them.With the region under study increased by five times while the dimension of the electrode capacitance model remain the same as first part, the results obtained are more precise as compared to the result obtained in part 1. Lastly, the report will end with a conclusion summarizing the knowledge the author have gained from the final year project as well as the recommendation for further enhancement in the future.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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