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|Title:||Distribution fitting for incomplete data||Authors:||Ooi, Eileen Pei Shan.||Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2011||Abstract:||This report reviews the effects of missing data on probability distributions which covers two main topics: (1) types of probability distributions and goodness-of-fit tests, and (2) missing data mechanisms and missing data techniques (MDT). The focus is to investigate the effects of missing data of a specified probability distribution and determine the best methods to fill in the missing values. An overview and comparison of the complete-data cases and incomplete-data cases are provided. Multiple imputation and Listwise Deletion, which are the two MDTs used are also discussed.||URI:||http://hdl.handle.net/10356/45865||Rights:||Nanyang Technological University||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Student Reports (FYP/IA/PA/PI)|
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