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Title: Distribution fitting for incomplete data
Authors: Ooi, Eileen Pei Shan.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Abstract: This report reviews the effects of missing data on probability distributions which covers two main topics: (1) types of probability distributions and goodness-of-fit tests, and (2) missing data mechanisms and missing data techniques (MDT). The focus is to investigate the effects of missing data of a specified probability distribution and determine the best methods to fill in the missing values. An overview and comparison of the complete-data cases and incomplete-data cases are provided. Multiple imputation and Listwise Deletion, which are the two MDTs used are also discussed.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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