Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4589
Title: Texture modeling and pattern analysis using statistical approach
Authors: Lei, Wang.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Issue Date: 2000
Abstract: Texture analysis plays an important role in computer vision and pattern recog-nition. The development of a new texture model, multiresolution Markov random field (MRMRF) model, and its application in texture classification, segmentation, and textured image retrieval are the central theme of this thesis. Filtering theory and Markov random field (MRF) model are fused together seamlessly by using a new energy function. The new energy function for the texture model is constructed based on Gibbs random field.
URI: http://hdl.handle.net/10356/4589
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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