Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/4589
Title: | Texture modeling and pattern analysis using statistical approach | Authors: | Lei, Wang. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing | Issue Date: | 2000 | Abstract: | Texture analysis plays an important role in computer vision and pattern recog-nition. The development of a new texture model, multiresolution Markov random field (MRMRF) model, and its application in texture classification, segmentation, and textured image retrieval are the central theme of this thesis. Filtering theory and Markov random field (MRF) model are fused together seamlessly by using a new energy function. The new energy function for the texture model is constructed based on Gibbs random field. | URI: | http://hdl.handle.net/10356/4589 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Theses |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
EEE-THESES_608.pdf Restricted Access | 17.33 MB | Adobe PDF | View/Open |
Page view(s) 50
465
Updated on Oct 4, 2024
Download(s)
3
Updated on Oct 4, 2024
Google ScholarTM
Check
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.