Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/46389| Title: | Predicting and timing of bank failure using neural networks | Authors: | Wong, Melvin Wai Leet | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems | Issue Date: | 2011 | Abstract: | Predicting bank failure using neural network | URI: | http://hdl.handle.net/10356/46389 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| e3010-091.doc Restricted Access | 3.97 MB | Microsoft Word | View/Open |
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