Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/46397
Title: High frequency characterization & analysis of advanced Si MOSFETS
Authors: Ng, Jing Ting.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Issue Date: 2011
Abstract: This report compiled all the work that had been done by the author during her Final Year Project subject to fulfill the course requirement under School of Electrical and Electronic Engineering (EEE), Nanyang Technological University.
URI: http://hdl.handle.net/10356/46397
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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