Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/46764| Title: | Weak signal detection for scanning near-field optical microscopy | Authors: | Ng, Boon Ping | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics | Issue Date: | 2010 | Source: | Ng, B. P. (2010). Weak signal detection for scanning near-field optical microscopy. Doctoral thesis, Nanyang Technological University, Singapore. | Abstract: | This thesis covers the development of enabling technologies for the Scanning Near-field Optical Microscopy(SNOM). Two key technologies form the foundation of the SNOM system: (i) the weak electrical signal detection for probe-sample distance regulation and (ii)the weak optical signal detection for the near-field region of the sample. | Description: | 170 p. | URI: | https://hdl.handle.net/10356/46764 | DOI: | 10.32657/10356/46764 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE_THESES_114.pdf | 21.28 MB | Adobe PDF |  View/Open |
Page view(s) 50
564
Updated on Mar 23, 2025
Download(s) 20
358
Updated on Mar 23, 2025
Google ScholarTM
Check
Altmetric
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.