Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/46764
Title: Weak signal detection for scanning near-field optical microscopy
Authors: Ng, Boon Ping
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2010
Source: Ng, B. P. (2010). Weak signal detection for scanning near-field optical microscopy. Doctoral thesis, Nanyang Technological University, Singapore.
Abstract: This thesis covers the development of enabling technologies for the Scanning Near-field Optical Microscopy(SNOM). Two key technologies form the foundation of the SNOM system: (i) the weak electrical signal detection for probe-sample distance regulation and (ii)the weak optical signal detection for the near-field region of the sample.
Description: 170 p.
URI: https://hdl.handle.net/10356/46764
DOI: 10.32657/10356/46764
Rights: Nanyang Technological University
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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