Weak signal detection for scanning near-field optical microscopy
Ng, Boon Ping
Date of Issue2010
School of Electrical and Electronic Engineering
This thesis covers the development of enabling technologies for the Scanning Near-field Optical Microscopy(SNOM). Two key technologies form the foundation of the SNOM system: (i) the weak electrical signal detection for probe-sample distance regulation and (ii)the weak optical signal detection for the near-field region of the sample.
DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Nanyang Technological University