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|Title:||Weak signal detection for scanning near-field optical microscopy||Authors:||Ng, Boon Ping||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics||Issue Date:||2010||Source:||Ng, B. P. (2010). Weak signal detection for scanning near-field optical microscopy. Doctoral thesis, Nanyang Technological University, Singapore.||Abstract:||This thesis covers the development of enabling technologies for the Scanning Near-field Optical Microscopy(SNOM). Two key technologies form the foundation of the SNOM system: (i) the weak electrical signal detection for probe-sample distance regulation and (ii)the weak optical signal detection for the near-field region of the sample.||Description:||170 p.||URI:||http://hdl.handle.net/10356/46764||Rights:||Nanyang Technological University||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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