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https://hdl.handle.net/10356/46865| Title: | Noise measurement circuit for avalanche photo diode | Authors: | Lim, Alvin Tong Wen. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2011 | Abstract: | Avalanche photodiodes (APD) are photodetectors which have higher internal gain compared to the other photodiodes. This is due to impact ionization therefore more sensitive compared to other semiconductor. The project concentrates on the noise measurement circuit for the APD. | Description: | 101 p. | URI: | http://hdl.handle.net/10356/46865 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE_THESES_204.pdf Restricted Access | 11.37 MB | Adobe PDF | View/Open |
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