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Title: Noise measurement circuit for avalanche photo diode
Authors: Lim, Alvin Tong Wen.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Abstract: Avalanche photodiodes (APD) are photodetectors which have higher internal gain compared to the other photodiodes. This is due to impact ionization therefore more sensitive compared to other semiconductor. The project concentrates on the noise measurement circuit for the APD.
Description: 101 p.
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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