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https://hdl.handle.net/10356/4688| Title: | Application of low frequency noise in the study of VLSI electromigration | Authors: | Lim, Shin Yeh. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Microelectronics | Issue Date: | 2002 | Abstract: | The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes. | URI: | http://hdl.handle.net/10356/4688 | Schools: | School of Electrical and Electronic Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-THESES_698.pdf Restricted Access | 5.23 MB | Adobe PDF | View/Open |
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