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Title: Application of low frequency noise in the study of VLSI electromigration
Authors: Lim, Shin Yeh.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Issue Date: 2002
Abstract: The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes.
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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