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dc.contributor.authorLim, Ying Yingen
dc.identifier.citationLim, Y. Y. (2005). High frequency measurement of dielectric properties for packaging materials. Master’s thesis, Nanyang Technological University, Singapore.en
dc.description.abstractThis thesis summarizes the purpose and milestones covered in the process of carrying out the project. Essentially, the project proposes to develop and implement a suitable method to measure the complex permittivity of thin (l-3mm) packaging materials used in the microelectronics industry. Apart from being able to measure over a large bandwidth from 0.1 -20 GHz and be relatively low cost and easy to implement, the technique also has to be reasonably accurate as compared to other available methods.en
dc.rightsNanyang Technological Universityen
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic packagingen
dc.titleHigh frequency measurement of dielectric properties for packaging materialsen
dc.contributor.supervisorMihai Dragos Rotaruen
dc.contributor.supervisorArokiaswami Alphonesen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.description.degreeMASTER OF ENGINEERING (EEE)en
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