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https://hdl.handle.net/10356/4750| Title: | Characterization of silicon nanocrystals embedded in SiO2 matrix | Authors: | Liu, Yang | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics | Issue Date: | 2005 | Source: | Liu, Y. (2005). Characterization of silicon nanocrystals embedded in SiO2 matrix. Doctoral thesis, Nanyang Technological University, Singapore. | Abstract: | In this thesis, we have synthesized Si nanocrystals (nc-Si) embedded in SiO2 films by implanting Si+ into SiO2 films that are thermally grown on Si substrates. | URI: | https://hdl.handle.net/10356/4750 | DOI: | 10.32657/10356/4750 | Rights: | Nanyang Technological University | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-THESES_753.pdf | 3.55 MB | Adobe PDF |  View/Open |
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