Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4750
Title: Characterization of silicon nanocrystals embedded in SiO2 matrix
Authors: Liu, Yang
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
Issue Date: 2005
Source: Liu, Y. (2005). Characterization of silicon nanocrystals embedded in SiO2 matrix. Doctoral thesis, Nanyang Technological University, Singapore.
Abstract: In this thesis, we have synthesized Si nanocrystals (nc-Si) embedded in SiO2 films by implanting Si+ into SiO2 films that are thermally grown on Si substrates.
URI: https://hdl.handle.net/10356/4750
DOI: 10.32657/10356/4750
Rights: Nanyang Technological University
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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