Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/47711
Title: Stress calculation and failure prevention for microelectronics devices
Authors: Wang, Fengtao
Keywords: DRNTU::Engineering::Manufacturing::Product engineering
Issue Date: 2011
Abstract: This project presents a numerical investigation on the thermo-mechanical reliability of microelectronics devices. Thermo-mechanical reliability is one of the major bottlenecks for both current and future microelectronics devices. The current finial year project is to study the Stress Calculation and Failure Prevention for Microelectronics Devices. Three major cases are investigated: 1) Hygro-thermal Induced Crack in Microelectronic Devices; 2) CTE Mismatch Induced Cracking in Microelectronic Devices; 3) Crack Tip Plastic Zone and Crack Tip Opening Displacement. Simulation work using the commercial Finite Element software ABAQUS are conducted to analyze the practical thermal problems with various parameters considered. It is found that materials used in the manufacturing process could greatly affect the reliability of microelectronics devices.
URI: http://hdl.handle.net/10356/47711
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Student Reports (FYP/IA/PA/PI)

Files in This Item:
File Description SizeFormat 
MP-B014.pdf
  Restricted Access
2.26 MBAdobe PDFView/Open

Page view(s) 50

218
checked on Oct 21, 2020

Download(s) 50

15
checked on Oct 21, 2020

Google ScholarTM

Check

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.