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https://hdl.handle.net/10356/4831| Title: | Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process | Authors: | Luo, Qi. | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Semiconductors | Issue Date: | 2001 | Abstract: | The main objective of this project is to analyze one of the functional memory test algorithm, named March tests, which are applied to Random Access Memory for detecting most common faults. Based on this integrated test method, a Driver board that contains Test Pattern Generator as well as auxilliary circuitry is designed for March test operation. | URI: | http://hdl.handle.net/10356/4831 | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Theses |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| EEE-THESES_826.pdf Restricted Access | 8.68 MB | Adobe PDF | View/Open |
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