Please use this identifier to cite or link to this item:
Title: Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
Authors: Luo, Qi.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Issue Date: 2001
Abstract: The main objective of this project is to analyze one of the functional memory test algorithm, named March tests, which are applied to Random Access Memory for detecting most common faults. Based on this integrated test method, a Driver board that contains Test Pattern Generator as well as auxilliary circuitry is designed for March test operation.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

Files in This Item:
File Description SizeFormat 
  Restricted Access
8.68 MBAdobe PDFView/Open

Page view(s) 50

Updated on Jan 15, 2021

Download(s) 50

Updated on Jan 15, 2021

Google ScholarTM


Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.