Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4921
Title: Development of IC test platform for DSP integrated circuit applications
Authors: Nagarajan Cheliyan
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2002
Abstract: This project is to develop a test platform for implementation of DSP chip functional and timing measurements.
URI: http://hdl.handle.net/10356/4921
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

Files in This Item:
File Description SizeFormat 
EEE-THESES_907.pdf
  Restricted Access
11.87 MBAdobe PDFView/Open

Page view(s) 20

229
Updated on Nov 25, 2020

Download(s) 20

5
Updated on Nov 25, 2020

Google ScholarTM

Check

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.