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Title: Enhancement of reliability data analysis software
Authors: Nay Lin Aung
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
Issue Date: 2002
Abstract: Reliability tests are now a common place for semiconductor industry; however, the analysis of the data is far from accurate. Software has been developed to meet the need of the industry. In this project, enhancement of the software will be made in the use of various physics-based models for the extrapolation of accelerated test data to the normal operation conditions.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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