Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/4967
Title: Characterization of deep submicrometer devices for RF applications
Authors: Ng, Tze Cheng.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Issue Date: 2001
Abstract: The objective of this project is to adaptively develop new high performance advanced SPICE compatible deep submicrometer MOSFETs models suitable for RFIC design, together with an efficient parameter extraction methodology. These models will incorporated the many effects induced by multi-finger MOS transistors and have the potential for resulting in the significant reduction in RFIC design cycle time and manufacturing costs.
URI: http://hdl.handle.net/10356/4967
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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